Wafer prober manually

 

 

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Manual wafer probe equipment for testing of wafers or packaged parts. Precision manual wafer prober with extensive options for research and production. 450PM Manual Probe Station · Upgradeable Manual 150mm-200mm Wafer Prober · Configurable for DC, RF, Microwave, and High Power applications · Ambient to 400C Manual analytical probe stations for 200 mm and 300 mm wafers Wentworth's manual FA series wafer probers M200FA and M300FA enable you to quickly obtain Manual Probe Systems. MPI TS50, TS150, TS200 & TS300 manual probe stations are open test systems which are easy to use and cost effectiveWafer Probe: Automatic or Manual Probing. Probing is so important! Testing of chips on a wafer is carried out by probing systems (linked to a tester) either Manual Prober for Low Current Measurement (for 8-inch wafer). Model 708fT. This manual prober model can measure fA-level low current. Features. Manual Probe Station for On-Wafer Measurements up to 150mm Probe Station, 200mm Probe Station| 300mm Probe Station. The MPI TS200-SE probe system Manual wafer probe stations for semiconductor probing of wafers or packaged parts. Manual wafer prober for DC & HF testing in Universities & Research.

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